What types of semiconductor material testing are available? What are the methods for testing semiconductor materials?

Semiconductor materials are the basic electronic materials for making semiconductor devices and integrated circuits. As technology develops and market requirements increase, the demands on semiconductor materials are becoming higher and higher. As a result, the testing requirements and accuracy of semiconductor materials have increased to prevent the performance of semiconductor devices from being affected by their defects and characteristics.

There are many semiconductor materials, and their testing contents include optical performance testing, electrical performance testing, and structural performance testing. The specific test contents and test methods for each are described below.

What are the semiconductor testing materials?

1. Wet electronic chemicals: acid and alkali, etching, solvent class

2. Photoresist and supporting reagents

Photoresist, negative gel developer, negative gel rinse solution, negative gel developer rinse solution, positive gel developer positive gel diluent,semiconductor system edge gel cleaner, negative gel stripping solution, positive gel stripping solution, and so on.

3. Battery materials: negative electrode materials, positive electrode materials, electrolyte, battery/electrolyte additives, battery diaphragm

4.Electronic component chemicals

Bismuth nitrate, aluminum sulfate, aluminum nitrate, potassium nitrate, calcium bromide, ammonium dichromate, molybdenum dichromate, chloride, ladder trichloride, phosphoric acid, sodium potassium silicate, aluminum silicate, magnesium sulfate, copper nitrate, strontium nitrate, ammonium hydrofluoric acid, carbonic acid, oxidized pins, magnesium fluoride, sodium sharp acid, oxidized rubbers, oxidized steel, and so on.

5. Gases for electronic industry

Methane, boron trichloride, argon trioxide, sulfur hexafluoride, octaoxocyclobutane, hexafluoroethane, carbon tetrafluoride, hydrogen chloride, carbon monoxide, nitrous oxide, silane and so on.

6. Printing electronic chemicals: printed circuit board materials and supporting chemicals, electronic ink, screen printing materials, etc.

7. Electronic adhesive

SMT chip red adhesive, LED chip silicone, UV adhesive, AB adhesive, filler adhesive, sealant, conductive silver adhesive, silicone, etc.

8. Electronic grade water: ultrapure water, purified water, etc.

9.Other electronic material testing types

CMP polishing materials, target materials, conductive compounds, liquid crystal polymers, polyester film,semiconductor test system antistatic materials, anticorrosive agents, packaging materials, LED / OLED materials, light-emitting materials, optical films, flat film, TFT-LCD panels and modules composed of materials, e-paper, silicon materials, solar cell films, etc.

Semiconductor material testing items and methods

Semiconductor material testing can be divided into electrical performance testing, optical performance testing and structural performance testing.

1. Electrical performance test

Electrical performance testing includes testing resistance, capacitance and current-voltage characteristics.

Test method: Measure the resistance of the semiconductor material with the four-probe method, and evaluate the conductivity of the material by calculating the resistivity. The capacitance is measured using an LCR meter to evaluate the dielectric properties of the material. Measure the current-voltage characteristics of semiconductor materials with a source meter to understand and evaluate the conductivity of semiconductor materials.

2. Optical Property Test

Optical performance testing mainly includes the measurement of absorbance, transmittance and spectral response.

Test method: use fiber optic spectrometer to measure the absorbance and transmittance of semiconductor materials,semiconductor solutions to understand the material's ability to absorb and transmit light. The spectral response of the semiconductor material can be analyzed by a spectrum analyzer to study its optical properties at different wavelengths.

3. Structural performance test

The structural performance test of semiconductor materials mainly includes the measurement of crystal structure and surface morphology.

Test method: X-ray diffractometer is used to measure the crystalline structure of the crystal, so as to evaluate the crystal quality and orientation of the semiconductor material. The surface morphology of the semiconductor material can be observed with a scanning electron microscope to understand the surface quality and morphology characteristics of the material.

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